A semiconductor integrated circuit device includes a plurality of column repair address lines configured to cross and a plurality of mat select lines; a fuse set unit including a plurality of latch units electrically coupled with the plurality of column repair address lines and the plurality of mat select lines; a fuse driving unit configured to provide fuse data to the latch units through the plurality of column repair address lines; and an equalizer configured to equalize the fuse data to a same level in response to a select signal of the fuse set unit and a boot-up signal of the fuse set unit.