Invention Grant
- Patent Title: Nonvolatile memory device and method of operating the same
- Patent Title (中): 非易失存储器件及其操作方法
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Application No.: US14594759Application Date: 2015-01-12
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Publication No.: US09368234B2Publication Date: 2016-06-14
- Inventor: Kyoung-Tae Kang
- Applicant: Kyoung-Tae Kang
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2014-0033107 20140321
- Main IPC: G11C16/06
- IPC: G11C16/06 ; G11C29/12 ; G11C29/02 ; G11C29/50 ; G11C16/26 ; G11C16/04

Abstract:
In a method of operating a nonvolatile memory device, an impedance calibration verifying operation is performed based on a data read command. The impedance calibration verifying operation ascertains whether an impedance calibration operation is normally performed for a data input/output (I/O) terminal of the nonvolatile memory device. A detection value is stored in a storage unit. The detection value indicates a result of the impedance calibration verifying operation. The detection value is output based on a first command received after the nonvolatile memory device receives the data read command. A data read operation or the impedance calibration operation is selectively performed based on the detection value.
Public/Granted literature
- US20150270010A1 NONVOLATILE MEMORY DEVICE AND METHOD OF OPERATING THE SAME Public/Granted day:2015-09-24
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