Invention Grant
- Patent Title: Thin film device and method for manufacturing thin film device
- Patent Title (中): 薄膜器件及薄膜器件制造方法
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Application No.: US14086639Application Date: 2013-11-21
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Publication No.: US09368247B2Publication Date: 2016-06-14
- Inventor: Keiichi Umeda
- Applicant: MURATA MANUFACTURING CO., LTD.
- Applicant Address: JP Kyoto-fu
- Assignee: Murata Manufacturing Co., Ltd.
- Current Assignee: Murata Manufacturing Co., Ltd.
- Current Assignee Address: JP Kyoto-fu
- Agency: Studebaker & Brackett PC
- Priority: JP2011-156201 20110715
- Main IPC: H01B1/02
- IPC: H01B1/02 ; H01G5/16 ; H01G4/33 ; B81C1/00 ; H03H9/17 ; C23C14/16 ; C23C14/34 ; H03H9/24 ; H03H9/13 ; C23C14/02 ; H03H3/02 ; H03H3/04 ; H03H9/02

Abstract:
In a thin film device including a thin film electrode which has a main electrode layer formed of tungsten, a thin film electrode having a low resistivity is realized. There is provided a thin film device including a thin film electrode that has an underlayer and a main electrode layer formed on the underlayer. The underlayer is formed of a titanium-tungsten alloy having a crystalline structure with a wavy-like surface morphology, and the main electrode layer is formed of tungsten having a crystalline structure with a wavy-like surface morphology.
Public/Granted literature
- US20140078640A1 THIN FILM DEVICE AND METHOD FOR MANUFACTURING THIN FILM DEVICE Public/Granted day:2014-03-20
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