Invention Grant
- Patent Title: Semiconductor apparatus
- Patent Title (中): 半导体装置
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Application No.: US13743125Application Date: 2013-01-16
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Publication No.: US09368390B2Publication Date: 2016-06-14
- Inventor: Chyi-Tsong Ni , I-Shi Wang , Hsin-Kuei Lee , Ching-Hou Su
- Applicant: Chyi-Tsong Ni , I-Shi Wang , Hsin-Kuei Lee , Ching-Hou Su
- Applicant Address: TW
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee Address: TW
- Agency: Hauptman Ham, LLP
- Main IPC: H01L21/30
- IPC: H01L21/30 ; H01L21/768 ; H01L23/00 ; B81C1/00

Abstract:
A method for fabricating a semiconductor apparatus including providing a first silicon substrate having a first contact, wherein providing the first silicon substrate comprises forming a silicide layer between the first silicon substrate and a first metal layer. The method further includes providing a second silicon substrate having a second contact comprising a second metal layer and placing the first contact in contact with the second contact. The method further includes heating the first and second metal layers to form a metallic alloy, whereby the metallic alloy bonds the first contact to the second contact.
Public/Granted literature
- US20130130496A1 SEMICONDUCTOR APPARATUS Public/Granted day:2013-05-23
Information query
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