Invention Grant
- Patent Title: Oxide material and semiconductor device
- Patent Title (中): 氧化物材料和半导体器件
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Application No.: US13325700Application Date: 2011-12-14
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Publication No.: US09368633B2Publication Date: 2016-06-14
- Inventor: Shunpei Yamazaki , Motoki Nakashima , Tatsuya Honda
- Applicant: Shunpei Yamazaki , Motoki Nakashima , Tatsuya Honda
- Applicant Address: JP Atsugi-shi, Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Atsugi-shi, Kanagawa-ken
- Agency: Robinson Intellectual Property Law Office, P.C.
- Agent Eric J. Robinson
- Priority: JP2010-282135 20101217; JP2011-151859 20110708
- Main IPC: H01B1/00
- IPC: H01B1/00 ; H01L29/786

Abstract:
An object is to provide a material suitably used for a semiconductor included in a transistor, a diode, or the like. Another object is to provide a semiconductor device including a transistor in which the condition of an electron state at an interface between an oxide semiconductor film and a gate insulating film in contact with the oxide semiconductor film is favorable. Further, another object is to manufacture a highly reliable semiconductor device by giving stable electric characteristics to a transistor in which an oxide semiconductor film is used for a channel. A semiconductor device is formed using an oxide material which includes crystal with c-axis alignment, which has a triangular or hexagonal atomic arrangement when seen from the direction of a surface or an interface and rotates around the c-axis.
Public/Granted literature
- US09240489B2 Oxide material and semiconductor device Public/Granted day:2016-01-19
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