Invention Grant
- Patent Title: Sensor dark pixel offset estimation
- Patent Title (中): 传感器暗像素偏移估计
-
Application No.: US14754005Application Date: 2015-06-29
-
Publication No.: US09369646B2Publication Date: 2016-06-14
- Inventor: Chwen-Yuan Ku , H. Keith Nishihara , M. Dirk Robinson
- Applicant: Skybox Imaging, Inc.
- Applicant Address: US CA Mountain View
- Assignee: Skybox Imaging, Inc.
- Current Assignee: Skybox Imaging, Inc.
- Current Assignee Address: US CA Mountain View
- Agency: Dority & Manning, P.A.
- Main IPC: H04N5/361
- IPC: H04N5/361

Abstract:
Examples of systems and methods to provide estimates of dark current for pixels of a photosensor as a function of the temperature of the sensor and the gain applied to the photosensor are described. In various implementations, the dark current estimated for each pixel can depend at least partly on a global scale factor and a global bias that depend on temperature and gain and a temperature-independent and gain-independent offset value for each pixel. The scale, bias, and offsets may be determined from multiple dark field images taken by the sensor over a range of operating temperatures. In some cases, the scale and bias can be determined using a subset of less than all the image pixels. Scale and bias derived for a particular sensor can be used in the calibration of different sensors.
Public/Granted literature
- US20150319385A1 Sensor Dark Pixel Offset Estimation Public/Granted day:2015-11-05
Information query