Invention Grant
US09372290B2 Spectrum analyzer and reflection type diffraction grating thereof 有权
频谱分析仪及其反射型衍射光栅

  • Patent Title: Spectrum analyzer and reflection type diffraction grating thereof
  • Patent Title (中): 频谱分析仪及其反射型衍射光栅
  • Application No.: US13696613
    Application Date: 2010-05-07
  • Publication No.: US09372290B2
    Publication Date: 2016-06-21
  • Inventor: Cheng-Hao KoYung-Chuan Wu
  • Applicant: Yung-Chuan Wu
  • International Application: PCT/CN2010/072515 WO 20100507
  • International Announcement: WO2011/137592 WO 20111110
  • Main IPC: G02B5/18
  • IPC: G02B5/18 G01J3/02 G01J3/18
Spectrum analyzer and reflection type diffraction grating thereof
Abstract:
A spectrum analyzer includes an input member, a predetermined output plane and a reflection type diffraction grating. The input member receives an optical signal. The reflection type diffraction grating includes a non-Rowland circle curved grating profile curved surface and a plurality of diffraction structures. The diffraction structures, each having a pitch and disposed on the grating profile curved surface, are configured to separate the optical signal into a plurality of spectral components. At least some pitches of the spectral components are different from each other. One of the spectral components indicating a central wavelength is emitted to the predetermined output plane in a direction substantially perpendicular to the predetermined output plane. The grating profile curved surface is used for focusing the spectral components on the predetermined output plane.
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