Invention Grant
- Patent Title: Method to pattern substrates
- Patent Title (中): 衬底图案方法
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Application No.: US14560202Application Date: 2014-12-04
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Publication No.: US09373519B2Publication Date: 2016-06-21
- Inventor: Karolien Jans , Alexandra Dusa , Tim Stakenborg
- Applicant: IMEC VZW
- Applicant Address: BE Leuven
- Assignee: IMEC VZW
- Current Assignee: IMEC VZW
- Current Assignee Address: BE Leuven
- Agency: McDonnell Boehnen Hulbert & Berghoff LLP
- Priority: EP13195678 20131204
- Main IPC: H01L21/306
- IPC: H01L21/306 ; H01L21/308 ; H01L29/06 ; H01L21/3205 ; H01L21/32 ; G01N33/487 ; B82Y40/00

Abstract:
A method for creating a pattern on a substrate (101) is presented, the method comprises: providing a substrate (101) comprising silicon; creating a sacrificial layer (102) on the substrate (101), wherein the sacrificial layer is formed on a first surface area (101a) of the substrate thereby leaving a second surface area (101b) exposed; depositing a first functional layer (103) at least on the second surface area (101b) of the substrate (101); removing the sacrificial layer (102); wherein: removing the sacrificial layer (102) is performed by etching the sacrificial layer (102) with an acidic aqueous solution that does not adversely affect the first functional layer (103) and the substrate (101).
Public/Granted literature
- US20150155179A1 Method to Pattern Substrates Public/Granted day:2015-06-04
Information query
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