Invention Grant
- Patent Title: Method, apparatus, and system for measurement of noise statistics and bit error ratio estimation
- Patent Title (中): 用于测量噪声统计和误码率估计的方法，装置和系统
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Application No.: US13842320Application Date: 2013-03-15
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Publication No.: US09374202B2Publication Date: 2016-06-21
- Inventor: Adee O. Ran , Amir Mezer , Ophir Gazinski , Sanjay R. Ravi , David G. Ellis , Stephen J. Peters , Jeffrey M. Shuey
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Patent Capital Group
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G01R19/00 ; H04L1/00 ; H04L1/20
Abstract:
A sample voltage is received from a device at a first slicer element and a second slicer element. A decision by the first slicer element based on the sample voltage is identified and compared with a decision of the second slicer element based on the sample voltage. The decision of the second slicer element is to be generated from a comparison of the sample voltage with a reference voltage for the second slicer element. Comparing the decisions can be the basis of a soft error ratio determined for a device.
Public/Granted literature
- US20140281763A1 METHOD, APPARATUS, AND SYSTEM FOR MEASUREMENT OF NOISE STATISTICS AND BIT ERROR RATIO ESTIMATION Public/Granted day:2014-09-18
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