Invention Grant
- Patent Title: Image defect visibility predictor
- Patent Title (中): 图像缺陷可见度预测器
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Application No.: US13349275Application Date: 2012-01-12
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Publication No.: US09378546B2Publication Date: 2016-06-28
- Inventor: Xiaochen Jing , Hila Nachlieli , Carl Staelin , Doron Shaked , Smadar Shiffman , Jan Allebach
- Applicant: Xiaochen Jing , Hila Nachlieli , Carl Staelin , Doron Shaked , Smadar Shiffman , Jan Allebach
- Applicant Address: NL Maastricht
- Assignee: Hewlett-Packard Indigo B.V.
- Current Assignee: Hewlett-Packard Indigo B.V.
- Current Assignee Address: NL Maastricht
- Main IPC: G06T7/00
- IPC: G06T7/00

Abstract:
In at least some examples, a system comprises a processor and a memory coupled to the processor. The memory stores an image defect visibility predictor that, when executed by the processor, compares an original image with a defect image and outputs a predicted defect visibility image (PDVI) that accounts for defect masking by the original image.
Public/Granted literature
- US20130182972A1 IMAGE DEFECT VISIBILITY PREDICTOR Public/Granted day:2013-07-18
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