Invention Grant
- Patent Title: Semiconductor device
- Patent Title (中): 半导体器件
-
Application No.: US14119732Application Date: 2012-05-24
-
Publication No.: US09379051B2Publication Date: 2016-06-28
- Inventor: Yasuo Shimobe , Ryuichi Murayama , Keiji Mitote
- Applicant: Yasuo Shimobe , Ryuichi Murayama , Keiji Mitote
- Applicant Address: JP Tokyo
- Assignee: SUMITOMO BAKELITE CO., LTD.
- Current Assignee: SUMITOMO BAKELITE CO., LTD.
- Current Assignee Address: JP Tokyo
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: JP2011-119606 20110527
- International Application: PCT/JP2012/063270 WO 20120524
- International Announcement: WO2012/165273 WO 20121206
- Main IPC: H01L23/495
- IPC: H01L23/495 ; H01L23/31 ; H01L23/00 ; C09J9/00 ; C09J11/04 ; H01L23/367 ; H01L23/498 ; C08K3/08 ; H01L23/373 ; H01L21/683

Abstract:
According to the present invention, a semiconductor having excellent yield is provided. The semiconductor device (10) of the present invention includes: a base material (die pad) (2), a semiconductor element (3), and an adhesive layer (1) intervening the space between the base material and the semiconductor element (3) to adhere the base material and the semiconductor element. Thermal conductive filler (8) is contained in the adhesive layer (1), and when the content of the thermal conductive filler dispersed in the whole of the adhesive layer is expressed as C, the content of the thermal conductive filler in the region 1 ranging from the interface of the adhesive layer at the side of the semiconductor element to the depth by 2 μm is expressed as C1, and the content of the thermal conductive filler in the region 2 ranging from the interface of the adhesive layer at the side of the base material to the depth by 2 μm is expressed as C2, the following formulae are satisfied: C1
Public/Granted literature
- US20150194376A1 SEMICONDUCTOR DEVICE Public/Granted day:2015-07-09
Information query
IPC分类: