Invention Grant
US09380985B2 X-ray tomosynthesis imaging device and calibration method of an X-ray tomosynthesis imaging device
有权
X射线断层成像装置和X射线断层成像装置的校准方法
- Patent Title: X-ray tomosynthesis imaging device and calibration method of an X-ray tomosynthesis imaging device
- Patent Title (中): X射线断层成像装置和X射线断层成像装置的校准方法
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Application No.: US14147113Application Date: 2014-01-03
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Publication No.: US09380985B2Publication Date: 2016-07-05
- Inventor: Sadato Akahori
- Applicant: FUJIFILM Corporation
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM Corporation
- Current Assignee: FUJIFILM Corporation
- Current Assignee Address: JP Tokyo
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: JP2011-149912 20110706; JP2011-153815 20110712
- Main IPC: A61B6/03
- IPC: A61B6/03 ; A61B6/02 ; A61B6/00 ; A61B6/04 ; G06T11/00 ; G06T7/20

Abstract:
The X-ray imaging device comprises an X-ray source that is able to move along a predetermined movement path, a movement unit configured to cause the X-ray source to move along the predetermined movement path, an imaging platform that is disposed to face the X-ray source, a flat-panel X-ray detector that is provided to the imaging platform, a marker that is disposed in the imaging platform, a control unit that causes the X-ray source to move and to capture images respectively including the marker from at least two positions, and an image processing unit that calculates a position of an image of the marker in each of the captured images and calculates a slope of a movement axis of the X-ray source with respect to the X-ray detector based on a relative relationship between positions of images of the marker.
Public/Granted literature
- US20140119500A1 X-RAY IMAGING DEVICE AND CALIBRATION METHOD THEREFOR Public/Granted day:2014-05-01
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