Invention Grant
- Patent Title: Transmitted light observation apparatus
- Patent Title (中): 透射光观察装置
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Application No.: US14062903Application Date: 2013-10-25
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Publication No.: US09383313B2Publication Date: 2016-07-05
- Inventor: Hitoshi Tanaka
- Applicant: JIN CO., LTD.
- Applicant Address: JP Gunma
- Assignee: JIN CO., LTD.
- Current Assignee: JIN CO., LTD.
- Current Assignee Address: JP Gunma
- Priority: JP2012-239561 20121030
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N21/59 ; G02C7/10

Abstract:
In order to allow for easy judgment of performance of optical material having a prescribed function, provided is a transmitted light observation apparatus comprising a light emitting section that generates light including light of a prescribed wavelength; a holding section that holds a first test material and a second test material arranged respectively in optical paths of the light generated by the light emitting section; and a reflecting portion that reflects at least a portion of the light transmitted respectively through the first test material and the second test material. Transmittance of the first test material for the light of the prescribed wavelength is different from transmittance of the second test material for the light of the prescribed wavelength. The light of the prescribed wavelength has a wavelength from 380 nm to 500 nm.
Public/Granted literature
- US20140118744A1 TRANSMITTED LIGHT OBSERVATION APPARATUS Public/Granted day:2014-05-01
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