A circuit for measuring instantaneous voltage drops in an IC is disclosed. In one embodiment, a measurement circuit is configured to perform measurements of a voltage drop between a supply voltage node and reference (e.g., ground) node. The measurement circuit may perform consecutive voltage measurements over a number of clock cycles. The measurements may be compared to a reference voltage, and the results of the comparisons may be provided to a register unit. The register unit may include a number of storage locations indicating at which cycles, if any, voltage droops have occurred. Additionally, the register may store information indicating maximum and minimum voltage droops.