Invention Grant
US09384083B2 Error location search circuit, and error check and correction circuit and memory device including the same
有权
错误位置搜索电路,以及错误检查和校正电路和包含相同的存储器件
- Patent Title: Error location search circuit, and error check and correction circuit and memory device including the same
- Patent Title (中): 错误位置搜索电路,以及错误检查和校正电路和包含相同的存储器件
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Application No.: US14034803Application Date: 2013-09-24
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Publication No.: US09384083B2Publication Date: 2016-07-05
- Inventor: Daisuke Fujiwara , Makoto Hirano
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-Do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Gyeonggi-Do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: JP2012-209529 20120924; JP2012-209772 20120924; KR10-2013-0096080 20130813
- Main IPC: H03M13/00
- IPC: H03M13/00 ; G06F11/10 ; H03M13/07 ; H03M13/15

Abstract:
Provided is an error check and correction (ECC) circuit which includes a Chien search unit configured to determine whether there is an error in a data string. The Chien search unit includes a circuit configured to calculate a first bit string by multiplying a plurality of elements of Galois Field GF(2n) and a value of (n-k)-bit, and calculate a second bit string by multiplying the plurality of elements and a value of k-bit; and a plurality of Chien search circuits configured to combine the first bit string and the second bit string to calculate the arbitrary element. The plurality of Chien search circuits are arranged in a matrix along a row direction and a column direction. The first bit string is provided in the row direction or the column direction, and the second bit string is provided in a direction different from the direction of the first bit string.
Public/Granted literature
Information query
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