Invention Grant
- Patent Title: Bit line sensing methods of memory devices
- Patent Title (中): 存储器件的位线检测方法
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Application No.: US14557788Application Date: 2014-12-02
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Publication No.: US09384802B2Publication Date: 2016-07-05
- Inventor: Sung-chul Park
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Myers Bigel & Sibley, P.A.
- Priority: KR10-2013-0148472 20131202
- Main IPC: G11C7/06
- IPC: G11C7/06 ; G11C7/12 ; G11C11/4091 ; G11C11/4094

Abstract:
Bit line sensing methods may be provided. The methods may include pre-charging a first bit line and a second bit line with a bit line pre-charge voltage. The first bit line may be connected to a first input terminal of a first inverter, and the second bit line may be connected to a second input terminal of a second inverter. The method may also include adjusting voltages of the first bit line and the second bit line corresponding to either threshold voltages of first and second pull-down circuits included in the first and second inverters respectively or threshold voltages of first and second pull-up circuits included in the first and second inverters respectively. The method may further include sharing charges of one of the first bit line and the second bit line with charges of a corresponding memory cell and amplifying a voltage difference between the first bit line and the second bit line.
Public/Granted literature
- US20150155015A1 BIT LINE SENSING METHODS OF MEMORY DEVICES Public/Granted day:2015-06-04
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