Invention Grant
US09384858B2 Computer system predicting memory failure 有权
计算机系统预测内存故障

Computer system predicting memory failure
Abstract:
The prediction of memory failure is obtained by reducing the voltage on a bank of memory cells to momentarily artificially age the memory cells and subjecting the memory cells to a test in which one or more predetermined vectors are written to and read from the memory cells to detect memory cell errors.
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