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US09384859B2 Repair circuit and semiconductor memory device including the same 有权
维修电路和半导体存储器件包括相同的

Repair circuit and semiconductor memory device including the same
Abstract:
A repair circuit includes a normal decoder suitable for decoding partial input addresses of input addresses in response to a first control signal, a comparison unit suitable for comparing the partial input addresses and partial repair addresses of repair addresses in response to a second control signal, and generating a column repair signal when the partial input addresses and the partial repair addresses correspond to each other, and a redundancy decoder suitable for decoding the repair addresses in response to the column repair signal.
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