Invention Grant
- Patent Title: Repair circuit and semiconductor memory device including the same
- Patent Title (中): 维修电路和半导体存储器件包括相同的
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Application No.: US14627875Application Date: 2015-02-20
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Publication No.: US09384859B2Publication Date: 2016-07-05
- Inventor: Tae-Sik Yun
- Applicant: SK hynix Inc.
- Applicant Address: KR Gyeonggi-do
- Assignee: SK Hynix Inc.
- Current Assignee: SK Hynix Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2014-0138225 20141014
- Main IPC: G11C7/00
- IPC: G11C7/00 ; G11C29/00 ; G11C8/10 ; G11C29/04 ; G11C29/50

Abstract:
A repair circuit includes a normal decoder suitable for decoding partial input addresses of input addresses in response to a first control signal, a comparison unit suitable for comparing the partial input addresses and partial repair addresses of repair addresses in response to a second control signal, and generating a column repair signal when the partial input addresses and the partial repair addresses correspond to each other, and a redundancy decoder suitable for decoding the repair addresses in response to the column repair signal.
Public/Granted literature
- US20160104546A1 REPAIR CIRCUIT AND SEMICONDUCTOR MEMORY DEVICE INCLUDING THE SAME Public/Granted day:2016-04-14
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