Reliability of a semiconductor device is improved. A method of manufacturing a semiconductor device includes a step of arranging a plurality of semiconductor chips next to each other over a chip mounting surface of a die pad. Further, the method of manufacturing a semiconductor device includes a step of electrically coupling the semiconductor chip and the semiconductor chip via a wire. In this regard, a pad (chip-to-chip connection pad) of the semiconductor chip on a second bonding side in the step of coupling the wire is provided such that it is distantly located from a peripheral portion of a surface of the semiconductor chip.