Invention Grant
US09385215B2 V-shaped SiGe recess volume trim for improved device performance and layout dependence
有权
V形SiGe凹槽体积修剪,以提高设备性能和布局依赖性
- Patent Title: V-shaped SiGe recess volume trim for improved device performance and layout dependence
- Patent Title (中): V形SiGe凹槽体积修剪,以提高设备性能和布局依赖性
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Application No.: US14182777Application Date: 2014-02-18
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Publication No.: US09385215B2Publication Date: 2016-07-05
- Inventor: Chao-Hsuing Chen , Ling-Sung Wang , Chi-Yen Lin
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Eschweiler & Associates, LLC
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H01L29/78 ; H01L29/04 ; H01L29/08

Abstract:
Some embodiments of the present disclosure relates to a method and a device to achieve a strained channel. A volume of a source or drain recess is controlled by a performing an etch of a substrate to produce a recess. An anisotropic etch stop layer is then formed by doping a bottom surface of the recess with a boron-containing dopant, which distorts the crystalline structure of the bottom surface. An anisotropic etch of the recess is then performed. The anisotropic etch stop layer resists anisotropic etching such that the recess comprises a substantially flat bottom surface after the anisotropic etch. The source or drain recess is then filled with a stress-inducing material to produce a strained channel.
Public/Granted literature
- US20140264440A1 V-SHAPED SIGE RECESS VOLUME TRIM FOR IMPROVED DEVICE PERFORMANCE AND LAYOUT DEPENDENCE Public/Granted day:2014-09-18
Information query
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