Invention Grant
- Patent Title: Built in self test and method for RF transceiver systems
- Patent Title (中): 内置射频收发系统的自检和方法
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Application No.: US14821194Application Date: 2015-08-07
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Publication No.: US09385774B2Publication Date: 2016-07-05
- Inventor: Sudipto Chakraborty
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent John R. Pessetto; Frank D. Cimino
- Main IPC: H04B1/40
- IPC: H04B1/40 ; H04B17/00 ; H04W52/02

Abstract:
Integrated circuit transceiver circuitry (2) includes a first resonant circuit (3A) coupled to a narrowband interface (6,7A,7B,21) between a first amplifier (3,20) and an interfacing circuit (4,8,9,44), including a programmable first reactive element (C) and a second reactive element (L). Amplitude sensing circuitry (42) senses a maximum amplitude of an in-phase signal (I) or a quadrature-phase signal (Q). An on-chip first tone generation circuit (38,38A,38B,38C) generates tones for injection into the in-phase signal and the quadrature-phase signal and operates in response to frequency scanning circuitry (30) and the amplitude sensing circuitry to adjust the first reactive element (C) to calibrate the first resonant circuit to a desired resonant frequency by selectively coupling reactive sub-elements (1, 2, 4, 8 . . . ×Cv) into the first reactive element (C).
Public/Granted literature
- US20150349834A1 BUILT IN SELF TEST AND METHOD FOR RF TRANSCEIVER SYSTEMS Public/Granted day:2015-12-03
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