Invention Grant
- Patent Title: Test method
- Patent Title (中): 测试方法
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Application No.: US14147385Application Date: 2014-01-03
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Publication No.: US09387669B2Publication Date: 2016-07-12
- Inventor: Hiroshi Takiguchi , Katsuyuki Moriya , Osamu Kasuga , Akira Sugawara
- Applicant: SEIKO EPSON CORPORATION
- Applicant Address: JP Tokyo
- Assignee: SEIKO EPSON CORPORATION
- Current Assignee: SEIKO EPSON CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Maschoff Brennan
- Priority: JP2013-000360 20130107
- Main IPC: B41J29/393
- IPC: B41J29/393 ; B41J2/01 ; B41M5/40 ; B41J2/045 ; D21H19/00 ; B41J2/21 ; B41M5/52 ; C09D11/36
Abstract:
A test method includes preparing a test medium including a base and an ink-receiving layer that absorbs ink to swell in the thickness direction thereof, applying an ink onto the ink-receiving layer by ejecting droplets of the ink from a liquid ejecting apparatus, and observing the test medium.
Public/Granted literature
- US20140192110A1 TEST METHOD Public/Granted day:2014-07-10
Information query
IPC分类:
