Invention Grant
- Patent Title: Nonvolatile memory structure
- Patent Title (中): 非易失性存储器结构
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Application No.: US14477818Application Date: 2014-09-04
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Publication No.: US09391083B2Publication Date: 2016-07-12
- Inventor: Te-Hsun Hsu , Wei-Ren Chen , Hsuen-Wei Chen , Mu-Ying Tsao , Ying-Je Chen
- Applicant: eMemory Technology Inc.
- Applicant Address: TW Hsinchu Science Park, Hsin-Chu
- Assignee: eMemory Technology Inc.
- Current Assignee: eMemory Technology Inc.
- Current Assignee Address: TW Hsinchu Science Park, Hsin-Chu
- Agent Winston Hsu; Scott Margo
- Main IPC: H01L29/788
- IPC: H01L29/788 ; H01L27/115 ; H01L29/423 ; H01L29/49 ; G11C5/14 ; G11C16/04 ; G11C16/28 ; G11C16/30 ; G11C7/12 ; H01L21/28

Abstract:
A nonvolatile memory structure included a P substrate, an N well in the P substrate, and a PMOS storage transistor. The PMOS storage transistor includes a floating gate and an auxiliary gate disposed in close proximity to the floating gate. The floating gate and the auxiliary gate are disposed directly on the same floating gate channel of the PMOS storage transistor. A gap is provided between the auxiliary gate and the floating gate such that the auxiliary gate and the floating gate are separated from each other at least directly above the floating gate channel.
Public/Granted literature
- US20150091074A1 NONVOLATILE MEMORY STRUCTURE Public/Granted day:2015-04-02
Information query
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