Invention Grant
US09395267B2 Parameter measurement of phase objects using tomographic imaging 有权
使用层析成像的相位对象的参数测量

Parameter measurement of phase objects using tomographic imaging
Abstract:
Briefly, embodiments of methods and/or systems for tomographic imaging are disclosed. In an example embodiment, optical measurements may be obtained for at least a portion of an illuminated object at a plurality of focal positions between the illuminated object and an imaging lens and at a plurality of angular orientations. Rotated representations of the optical measurements may be projected onto a coordinate plane in which in-focus and out-of-focus rotated representations of the optical measurements may form a cross-sectional image of the illuminated portion of the object.
Public/Granted literature
Information query
Patent Agency Ranking
0/0