Invention Grant
- Patent Title: Parameter measurement of phase objects using tomographic imaging
- Patent Title (中): 使用层析成像的相位对象的参数测量
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Application No.: US13916515Application Date: 2013-06-12
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Publication No.: US09395267B2Publication Date: 2016-07-19
- Inventor: Andrew D. Yablon
- Applicant: Interfiber Analysis, LLC
- Applicant Address: US MA Sharon
- Assignee: Interfiber Analysis, LLC
- Current Assignee: Interfiber Analysis, LLC
- Current Assignee Address: US MA Sharon
- Agency: Berkeley Law & Technology Group, LLP
- Main IPC: G01J3/28
- IPC: G01J3/28 ; G01M11/00 ; A61B5/00 ; G01N21/47 ; G01N33/483

Abstract:
Briefly, embodiments of methods and/or systems for tomographic imaging are disclosed. In an example embodiment, optical measurements may be obtained for at least a portion of an illuminated object at a plurality of focal positions between the illuminated object and an imaging lens and at a plurality of angular orientations. Rotated representations of the optical measurements may be projected onto a coordinate plane in which in-focus and out-of-focus rotated representations of the optical measurements may form a cross-sectional image of the illuminated portion of the object.
Public/Granted literature
- US20140368811A1 TOMOGRAPHIC IMAGING Public/Granted day:2014-12-18
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