Invention Grant
- Patent Title: Temperature control device and temperature element
- Patent Title (中): 温度控制装置和温度元件
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Application No.: US14126750Application Date: 2012-05-08
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Publication No.: US09400128B2Publication Date: 2016-07-26
- Inventor: Shigeo Yamaguchi
- Applicant: Shigeo Yamaguchi
- Applicant Address: JP Kanagawa
- Assignee: KANAGAWA UNIVERSITY
- Current Assignee: KANAGAWA UNIVERSITY
- Current Assignee Address: JP Kanagawa
- Agency: Cantor Colburn LLP
- Priority: JP2011-134496 20110616
- International Application: PCT/JP2012/061747 WO 20120508
- International Announcement: WO2012/172884 WO 20121220
- Main IPC: F25B21/02
- IPC: F25B21/02 ; B01L7/00

Abstract:
A temperature element may be provided with: a combination of a p type semiconductor and an n type semiconductor disposed separated from each other; a metal well, which has a mounting part on which a container for DNA samples is directly mounted and which is connected to both the p type semiconductor and the n type semiconductor individually; an electrode and heat dissipating plate that is connected to the p type semiconductor and to which a voltage is applied by a temperature control section; and an electrode and heat dissipating plate that is connected to the n type semiconductor and to which a voltage is applied by the temperature control section. The shape of the metal well is formed into substantially the same shape as the outside shape of the container for DNA samples.
Public/Granted literature
- US20140130518A1 TEMPERATURE CONTROL DEVICE AND TEMPERATURE ELEMENT Public/Granted day:2014-05-15
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