A diagnostic system includes a semiconductor light emitter(s) configured to generate an input beam having a wavelength shorter than about 2.5 microns. An optical amplifier(s) configured to receive a portion of the input beam communicates an intermediate beam to an output end of the optical amplifier. An optical fiber(s) configured to receive a portion of the intermediate beam forms an output beam with an associated wavelength. A subsystem having lenses or mirrors receives a received portion of the output beam and delivers a delivered portion of the output beam to a sample. The delivered portion has a temporal duration greater than approximately 30 picoseconds and a repetition rate between continuous wave and Megahertz or higher. A time averaged intensity of the delivered portion is less than approximately 50 MW/cm2. A light detection system collects and analyzes a fraction of the delivered portion that reflects or transmits from the sample.