Invention Grant
- Patent Title: Fine particle measuring apparatus
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Application No.: US14717197Application Date: 2015-05-20
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Publication No.: US09400251B2Publication Date: 2016-07-26
- Inventor: Nao Nitta
- Applicant: Sony Corporation
- Applicant Address: JP Tokyo
- Assignee: Sony Corporation
- Current Assignee: Sony Corporation
- Current Assignee Address: JP Tokyo
- Agency: K&L Gates LLP
- Priority: JP2011-199892 20110913
- Main IPC: G01N23/04
- IPC: G01N23/04 ; G01N21/64 ; G01N15/14 ; G01N21/27 ; G01N15/10 ; G01N15/00

Abstract:
A fine particle measuring apparatus is provided. The fine particle measuring apparatus includes a detection unit configured to detect light emitted from a fine particle and a processing unit having a memory device storing instructions which when executed by the processing unit, cause the processing unit to calculate a corrected intensity value of the detected light and generate spectrum data based on the corrected intensity value.
Public/Granted literature
- US20150253247A1 FINE PARTICLE MEASURING APPARATUS Public/Granted day:2015-09-10
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