Invention Grant
- Patent Title: Ultrasonic test equipment and evaluation method thereof
- Patent Title (中): 超声波检测设备及其评估方法
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Application No.: US14184874Application Date: 2014-02-20
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Publication No.: US09400264B2Publication Date: 2016-07-26
- Inventor: Setsu Yamamoto , Jun Semboshi , Masahiro Yoshida , Takahiro Miura , Kazumi Watanabe , Makoto Ochiai , Satoshi Nagai
- Applicant: Kabushiki Kaisha Toshiba
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner LLP
- Priority: JP2013-031456 20130220
- Main IPC: G01N29/34
- IPC: G01N29/34 ; G01N29/04 ; G01N29/44 ; G01N29/46

Abstract:
An ultrasonic test equipment includes: a signal generating mechanism that generates a voltage waveform; an ultrasonic transmitting mechanism that excites ultrasonic vibrations having a lower frequency than a predetermined frequency to an object to be tested; an ultrasonic receiving mechanism that receives an ultrasonic response from the object to be tested; an AD converting mechanism that digitizes the received ultrasonic waveform; an analyzing mechanism that performs frequency analysis of the digital ultrasonic waveform digitized by the AD converting mechanism; an evaluating mechanism that extracts a variation of a nonlinear ultrasonic component from a frequency component of the digital ultrasonic wave obtained by the frequency analysis, compares the variation with defect data information in a defect information database, identifies a physical quantity of defect information of the object to be tested, and evaluates a defect in the object to be tested; and a control mechanism that partly or entirely controls a measurement system.
Public/Granted literature
- US20140230556A1 Ultrasonic Test Equipment and Evaluation Method Thereof Public/Granted day:2014-08-21
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