Invention Grant
- Patent Title: X-ray radiation detector and CT system
- Patent Title (中): X射线辐射检测器和CT系统
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Application No.: US14418096Application Date: 2013-07-10
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Publication No.: US09400335B2Publication Date: 2016-07-26
- Inventor: Fabrice Dierre , Björn Kreisler , Miguel Labayen De Inza , Daniel Niederlöhner , Christian Schröter , Matthias Strassburg
- Applicant: Siemens Aktiengesellschaft
- Applicant Address: DE Munich
- Assignee: SIEMENS AKTIENGESELLSCHAFT
- Current Assignee: SIEMENS AKTIENGESELLSCHAFT
- Current Assignee Address: DE Munich
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: DE102012213410 20120731
- International Application: PCT/EP2013/064535 WO 20130710
- International Announcement: WO2014/019822 WO 20140206
- Main IPC: G01T1/24
- IPC: G01T1/24 ; H01L31/0224 ; H01L31/115 ; A61B6/03 ; A61B6/00

Abstract:
A direct-converting x-ray radiation detector is disclosed for detecting x-ray radiation, at least including a semiconductor used to detect x-ray radiation and at least one electrode attached to the semiconductor. In an embodiment, the semiconductor and the at least one electrode are electrically conductively connected and the at least one electrode is designed to be transparent and electrically conductive. A CT system is further disclosed, at least including the direct-converting x-ray radiation detector.
Public/Granted literature
- US20150260856A1 X-RAY RADIATION DETECTOR AND CT SYSTEM Public/Granted day:2015-09-17
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