Invention Grant
- Patent Title: Method of matching image features with reference features
- Patent Title (中): 匹配图像特征与参考特征的方法
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Application No.: US14240988Application Date: 2011-08-31
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Publication No.: US09400941B2Publication Date: 2016-07-26
- Inventor: Daniel Kurz , Peter Meier
- Applicant: Daniel Kurz , Peter Meier
- Applicant Address: DE Munich
- Assignee: Metaio GmbH
- Current Assignee: Metaio GmbH
- Current Assignee Address: DE Munich
- Agency: Blank Rome LLP
- International Application: PCT/EP2011/065002 WO 20110831
- International Announcement: WO2013/029674 WO 20130307
- Main IPC: G06K9/36
- IPC: G06K9/36 ; G06K9/62 ; G06K9/46 ; G06T7/20 ; G06T7/00

Abstract:
A method of matching image features with reference features comprises the steps of providing a current image, providing a set of reference features, wherein each of the reference features comprises at least one first parameter which is at least partially indicative of a position and/or orientation of the reference feature with respect to a global coordinate system, wherein the global coordinate system is an earth coordinate system or an object coordinate system, or at least partially indicative of a position of the reference feature with respect to an altitude, detecting at least one feature in the current image in a feature detection process, associating with the detected feature at least one second parameter which is at least partially indicative of a position and/or orientation of the detected feature, or which is at least partially indicative of a position of the detected feature with respect to an altitude, and matching the detected feature with a reference feature by determining a similarity measure.
Public/Granted literature
- US20150161476A1 METHOD OF MATCHING IMAGE FEATURES WITH REFERENCE FEATURES Public/Granted day:2015-06-11
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