Invention Grant
- Patent Title: Methods and apparatus for improved pattern detection
- Patent Title (中): 改进模式检测的方法和装置
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Application No.: US14924648Application Date: 2015-10-27
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Publication No.: US09401166B2Publication Date: 2016-07-26
- Inventor: Linjiang Guo , Zhi Bin Li , Yao Zhao , Dahua Qin
- Applicant: Avago Technologies General IP (Singapore) Pte. Ltd.
- Applicant Address: SG Singapore
- Assignee: Avago Technologies General IP (Singapore) Pte. Ltd.
- Current Assignee: Avago Technologies General IP (Singapore) Pte. Ltd.
- Current Assignee Address: SG Singapore
- Priority: CN201310284484 20130709
- Main IPC: G11B5/09
- IPC: G11B5/09 ; G11B5/596

Abstract:
Improved pattern detection is provided for a predefined pattern in data. A detection threshold employed by a Euclidean detector to detect a pattern (such as a Servo Address Mark) may be adjusted based upon data gathered that corresponds to an indication of a detected pattern by one of a plurality of pattern detectors.
Public/Granted literature
- US20160049168A1 Methods and Apparatus for Improved Pattern Detection Public/Granted day:2016-02-18
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