Invention Grant
US09401166B2 Methods and apparatus for improved pattern detection 有权
改进模式检测的方法和装置

Methods and apparatus for improved pattern detection
Abstract:
Improved pattern detection is provided for a predefined pattern in data. A detection threshold employed by a Euclidean detector to detect a pattern (such as a Servo Address Mark) may be adjusted based upon data gathered that corresponds to an indication of a detected pattern by one of a plurality of pattern detectors.
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