Invention Grant
US09401192B2 Ferroelectric memory device and timing circuit to control the boost level of a word line
有权
铁电存储器件和定时电路,用于控制字线的升压电平
- Patent Title: Ferroelectric memory device and timing circuit to control the boost level of a word line
- Patent Title (中): 铁电存储器件和定时电路,用于控制字线的升压电平
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Application No.: US14479025Application Date: 2014-09-05
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Publication No.: US09401192B2Publication Date: 2016-07-26
- Inventor: Masaki Okuda , Keizo Morita , Tomohisa Hirayama
- Applicant: FUJITSU SEMICONDUCTOR LIMITED
- Applicant Address: JP Yokohama
- Assignee: FUJITSU SEMICONDUCTOR LIMITED
- Current Assignee: FUJITSU SEMICONDUCTOR LIMITED
- Current Assignee Address: JP Yokohama
- Agency: Arent Fox LLP
- Priority: JP2013-216500 20131017
- Main IPC: G11C8/08
- IPC: G11C8/08 ; G11C8/10 ; G11C8/18

Abstract:
A semiconductor memory device includes a memory cell array, a word line decoder, a time determination signal generation circuit, and a timing circuit. The memory cell array is configured to include a plurality of memory cells, and the word line decoder is configured to control selection and a voltage level of a word line connected to each of the memory cells. The time determination signal generation circuit is configured to generate a time determination signal indicating a determination time, the determination time being a reference by which a change in a command is determined, and the timing circuit is configured to determine the change in the command from the time determination signal and generate a control signal which controls whether or not a selected word line is pre-charged.
Public/Granted literature
- US20150109875A1 SEMICONDUCTOR MEMORY DEVICE Public/Granted day:2015-04-23
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