Invention Grant
- Patent Title: Fuse circuit and semiconductor apparatus including the same
- Patent Title (中): 保险丝电路及包括其的半导体装置
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Application No.: US14573707Application Date: 2014-12-17
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Publication No.: US09401218B2Publication Date: 2016-07-26
- Inventor: Jung Taek You
- Applicant: SK hynix Inc.
- Applicant Address: KR Icheon-si, Gyeonggi-do
- Assignee: SK hynix Inc.
- Current Assignee: SK hynix Inc.
- Current Assignee Address: KR Icheon-si, Gyeonggi-do
- Agency: William Park & Associates Ltd.
- Priority: KR10-2014-0134977 20141007
- Main IPC: G11C17/00
- IPC: G11C17/00 ; G11C17/18 ; G11C17/16

Abstract:
A fuse circuit includes an E-fuse array including a plurality of E-fuse elements configured to store fuse data; a latch block including a plurality of latch groups configured to latch the fuse data read from the E-fuse array; and a control block configured to output latch reset signals corresponding to the plurality of latch groups in response to an apparatus reset signal and a clock signal, wherein the control block sequentially enables the latch reset signals.
Public/Granted literature
- US20160099074A1 FUSE CIRCUIT AND SEMICONDUCTOR APPARATUS INCLUDING THE SAME Public/Granted day:2016-04-07
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