Invention Grant
US09401219B2 Electronic fuse semiconductor device for selecting failed redundancy word lines
有权
用于选择故障冗余字线的电子熔丝半导体器件
- Patent Title: Electronic fuse semiconductor device for selecting failed redundancy word lines
- Patent Title (中): 用于选择故障冗余字线的电子熔丝半导体器件
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Application No.: US14586007Application Date: 2014-12-30
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Publication No.: US09401219B2Publication Date: 2016-07-26
- Inventor: Young Bo Shim
- Applicant: SK hynix Inc.
- Applicant Address: KR Icheon-si, Gyeonggi-do
- Assignee: SK hynix Inc.
- Current Assignee: SK hynix Inc.
- Current Assignee Address: KR Icheon-si, Gyeonggi-do
- Agency: William Park & Associates Ltd.
- Priority: KR10-2014-0145529 20141024
- Main IPC: G11C17/18
- IPC: G11C17/18 ; G11C17/16 ; G11C29/04 ; G11C29/00
Abstract:
A semiconductor device with a fuse controller and a fuse array. The fuse controller may be configured to generate internal address signals according to a level combination of repair data and may generate first and second voltage control signals in response to a rupture control signal that is enabled to rupture a predetermined fuse set for selecting a failed redundancy word line, in a test mode. The fuse array may include a plurality of fuse sets including the predetermined fuse set. Each of the plurality of fuse sets may be selected according to a level combination of the internal address signals, and the fuse array ruptures the predetermined fuse set for selecting the failed redundancy word line in response to the first and second voltage control signals to output fuse data.
Public/Granted literature
- US20160118139A1 SEMICONDUCTOR DEVICES Public/Granted day:2016-04-28
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