Invention Grant
- Patent Title: Semiconductor device and fabrication method
- Patent Title (中): 半导体器件及其制造方法
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Application No.: US14001260Application Date: 2012-02-24
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Publication No.: US09401404B2Publication Date: 2016-07-26
- Inventor: Huiyun Liu , Alwyn John Seeds , Francesca Pozzi
- Applicant: Huiyun Liu , Alwyn John Seeds , Francesca Pozzi
- Applicant Address: GB London
- Assignee: UCL BUSINESS PLC
- Current Assignee: UCL BUSINESS PLC
- Current Assignee Address: GB London
- Agency: King & Spalding LLP
- Agent Kenneth H. Sonnenfeld
- Priority: GB1103342.0 20110226
- International Application: PCT/GB2012/000190 WO 20120224
- International Announcement: WO2012/114074 WO 20120830
- Main IPC: H01S5/00
- IPC: H01S5/00 ; H01L29/267 ; H01L21/02 ; H01S5/02 ; H01S5/34 ; H01S5/30 ; H01S5/062 ; H01S5/20 ; H01S5/22 ; B82Y40/00

Abstract:
A semiconductor device is disclosed comprising: a substrate having a surface comprising germanium; a layer of gallium on said surface; and a layer of gallium arsenide on the gallium covered surface. The semiconductor heterostructure of gallium arsenide on germanium is fabricated by the steps of: protecting by a shutter a surface comprising germanium in an environment having a partial pressure of arsenic less than 10−8torr; epitaxially growing a layer of gallium on the said surface immediately after exposure of said surface; and epitaxially growing a layer of gallium arsenide on the gallium covered surface.
Public/Granted literature
- US20140016659A1 Semiconductor Device and Fabrication Method Public/Granted day:2014-01-16
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