Invention Grant
- Patent Title: Bias-temperature induced damage mitigation circuit
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Application No.: US14642797Application Date: 2015-03-10
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Publication No.: US09401643B1Publication Date: 2016-07-26
- Inventor: David M. Onsongo , David P. Paulsen , Kirk D. Peterson , John E. Sheets, II
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Scott S. Dobson; Robert Williams
- Main IPC: H03K19/09
- IPC: H03K19/09 ; H02M3/158 ; G05F3/26 ; H03K19/094

Abstract:
A circuit that regulates electrical current flow through an integrated circuit involves a sequencing circuit connected to a clock signal generator, the sequencing circuit configured to, responsive to receiving a clock signal from the clock signal generator, generate a set of sequencing signals that includes a first switching signal, a second switching signal, and a disable signal. The circuit also involves a switching circuit connected to the sequencing circuit, the switching circuit configured to receive the first switching signal and the second switching signal and a current mirror connected to the switching circuit and the sequencing circuit, the current mirror configured to receive an activation signal from a current control logic circuit and to receive the disable signal.
Information query
IPC分类: