Invention Grant
- Patent Title: Background calibration of time-interleaved analog-to-digital converters
- Patent Title (中): 时间交织模数转换器的背景校准
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Application No.: US14554790Application Date: 2014-11-26
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Publication No.: US09401726B2Publication Date: 2016-07-26
- Inventor: Kareem A. Ragab , John Khoury
- Applicant: Silicon Laboratories Inc.
- Applicant Address: US TX Austin
- Assignee: Silicon Laboratories Inc.
- Current Assignee: Silicon Laboratories Inc.
- Current Assignee Address: US TX Austin
- Agency: Abel Law Group, LLP
- Main IPC: H03M1/10
- IPC: H03M1/10 ; H03M1/06 ; H03M1/12 ; H03M1/00

Abstract:
A robust and fast background calibration technique for correction of time-interleaved ADC offset, gain, bandwidth, and timing mismatches is proposed. The technique combines the use of a calibration signal and a reference ADC. The calibration signal enhances robustness and makes the technique independent of the input signal's statistics. The reference ADC speeds up convergence and enables the use of a small amplitude calibration signal that does not significantly reduce the input signal dynamic range. The calibration signal can be subtracted or filtered from the ADC output and is therefore invisible to the ADC user.
Public/Granted literature
- US20160149582A1 Background Calibration of Time-Interleaved Analog-to-Digital Converters Public/Granted day:2016-05-26
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