A method for testing an Integrated Circuit (IC) with Near Field Communication (NFC) technology according to a first embodiment of the present invention includes: utilizing a BB modem of the IC to generate a known data pattern; modulating the known data pattern to generate a modulated data pattern; sending the modulated data pattern on the transmitting path to an NFC antenna of the IC and utilizing the NFC antenna to loop the modulated data pattern back to the receiving path; demodulating the modulated data pattern; and determining if the data pattern on the transmitting path is the same as the data pattern on the receiving path. When the data pattern on the transmitting path is not the same as the data pattern on the receiving path, it is determined that the IC fails.