Invention Grant
US09404798B2 Control apparatus and control method having a slit selection based upon acquired half value wavelength of incident spectrum
有权
控制装置和控制方法具有基于获取的入射光谱的半值波长的狭缝选择
- Patent Title: Control apparatus and control method having a slit selection based upon acquired half value wavelength of incident spectrum
- Patent Title (中): 控制装置和控制方法具有基于获取的入射光谱的半值波长的狭缝选择
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Application No.: US14468900Application Date: 2014-08-26
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Publication No.: US09404798B2Publication Date: 2016-08-02
- Inventor: Hideya Tomita
- Applicant: NEC Corporation
- Applicant Address: JP Tokyo
- Assignee: NEC CORPORATION
- Current Assignee: NEC CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Young & Thompson
- Priority: JP2013-244132 20131126
- Main IPC: G01J3/04
- IPC: G01J3/04 ; G01J3/18
Abstract:
A control apparatus includes a slit plate including a plurality of rectangular slits with different widths. The control apparatus also includes an acquisition unit which acquires an incident spectrum from the rectangular slit. The apparatus also includes a slit selecting unit which acquires a half value wavelength of the incident spectrum on the basis of the incident spectrum, and performs a selection of one of the plurality of rectangular slits on the basis of the half value wavelength.
Public/Granted literature
- US20150144766A1 CONTROL APPARATUS AND CONTROL METHOD Public/Granted day:2015-05-28
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