Invention Grant
- Patent Title: Leak test method and leak test apparatus
- Patent Title (中): 泄漏试验方法和泄漏试验装置
-
Application No.: US14353406Application Date: 2012-10-22
-
Publication No.: US09404828B2Publication Date: 2016-08-02
- Inventor: Tetsuya Yamaguchi
- Applicant: Tetsuya Yamaguchi
- Applicant Address: JP Toyota-shi
- Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHA
- Current Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHA
- Current Assignee Address: JP Toyota-shi
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P
- Priority: JP2011-235510 20111026
- International Application: PCT/IB2012/002116 WO 20121022
- International Announcement: WO2013/061130 WO 20130502
- Main IPC: G01M3/02
- IPC: G01M3/02 ; G01L19/00 ; G01M3/34 ; G01M3/32
Abstract:
A leak test method includes: reducing first pressure in an inspection space in a work and second pressure in a space in a master chamber; humidifying the inspection space in the work; and detecting a change in differential pressure between the inspection space in the work and the space in the master chamber, while the inspection space in the work is in a water-vapor saturated state. Also, in this leak test method, a leak in the inspection space in the work is detected from the change in the differential pressure.
Public/Granted literature
- US20140338427A1 LEAK TEST METHOD AND LEAK TEST APPARATUS Public/Granted day:2014-11-20
Information query
