Invention Grant
- Patent Title: Second and third order simultaneously non-linear optical processes and measurements for surface analysis
- Patent Title (中): 二阶和三阶同时非线性光学过程和表面分析测量
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Application No.: US14520850Application Date: 2014-10-22
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Publication No.: US09404854B2Publication Date: 2016-08-02
- Inventor: Jeffrey H. Hunt , John H. Belk
- Applicant: The Boeing Company
- Applicant Address: US IL Chicago
- Assignee: The Boeing Company
- Current Assignee: The Boeing Company
- Current Assignee Address: US IL Chicago
- Agency: Nexsen Pruet, PLLC
- Main IPC: G01J5/02
- IPC: G01J5/02 ; G01N21/3581 ; G01N21/65
Abstract:
Methods, systems and apparatuses are disclosed for interrogating characteristics of a substrate material surface and sub-surface by evaluating Terahertz output signals generated by non-Terahertz, optical source inputs.
Public/Granted literature
- US20160116401A1 SECOND AND THIRD ORDER SIMULTANEOUSLY NON-LINEAR OPTICAL PROCESSES AND MEASUREMENTS FOR SURFACE ANALYSIS Public/Granted day:2016-04-28
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