Invention Grant
- Patent Title: Luminescence microscopy
- Patent Title (中): 发光显微镜
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Application No.: US13518115Application Date: 2010-10-22
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Publication No.: US09404867B2Publication Date: 2016-08-02
- Inventor: Michael Kempe , Ralf Netz , Gerhard Krampert
- Applicant: Michael Kempe , Ralf Netz , Gerhard Krampert
- Applicant Address: DE Jena
- Assignee: Carl Zeiss Microscopy GmbH
- Current Assignee: Carl Zeiss Microscopy GmbH
- Current Assignee Address: DE Jena
- Agency: Skaar Ulbrich Macari, P.A.
- Priority: DE102009055216 20091222
- International Application: PCT/EP2010/065969 WO 20101022
- International Announcement: WO2011/076458 WO 20110630
- Main IPC: G01N21/64
- IPC: G01N21/64 ; G02B21/16

Abstract:
A luminescence microscopy method includes a sample being used, which comprises a certain substance, wherein the certain substance can be converted repeatedly from a first state, in which it can be excited into emitting luminescence radiation, into a second state, in which it cannot be excited into emitting luminescence radiation. The substance present in the sample can be brought into the first state by irradiating switch radiation. The certain substance can be excited into emitting luminescence radiation by irradiating excitation radiation. The sample emitting luminescence radiation can be displayed. A high-resolution selection of sample regions extending perpendicularly to a sample surface is carried out by irradiating either the switch radiation or the excitation radiation as structured illumination of the sample. A high-resolution selection of the sample surface is carried out by irradiating the switch radiation and/or the excitation radiation as TIRF illumination of the sample.
Public/Granted literature
- US20120319007A1 LUMINESCENCE MICROSCOPY Public/Granted day:2012-12-20
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