Invention Grant
- Patent Title: Method and system for extracting spectroscopic information from images and waveforms
- Patent Title (中): 从图像和波形提取光谱信息的方法和系统
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Application No.: US14228340Application Date: 2014-03-28
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Publication No.: US09404875B2Publication Date: 2016-08-02
- Inventor: Willem G. J. Langeveld
- Applicant: Rapiscan Systems, Inc.
- Applicant Address: US CA Torrance
- Assignee: Rapiscan Systems, Inc.
- Current Assignee: Rapiscan Systems, Inc.
- Current Assignee Address: US CA Torrance
- Agency: Novel IP
- Main IPC: G01N23/06
- IPC: G01N23/06 ; G01N23/087
Abstract:
The application discloses systems and methods for determining an atomic number of a material being scanned by generating a predetermined number of transmission data samples, determining a variance of the transmission data samples, and determining the atomic number of the material being scanned by comparing the variance or a derivative of the variance of the transmission data samples to one or more predetermined variances. The application also discloses systems and methods for determining an atomic number of a material being scanned by deriving transmission signal samples of the material being scanned, determining a variance of the signal samples, and determining an atomic number of the material being scanned by comparing the variance of the signal samples, or a derivative of the variance, to one or more predetermined variances.
Public/Granted literature
- US20140341340A1 Method and System for Extracting Spectroscopic Information from Images and Waveforms Public/Granted day:2014-11-20
Information query
