Invention Grant
- Patent Title: Dielectric strength voltage testing method for electronics device
- Patent Title (中): 电子器件绝缘强度电压测试方法
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Application No.: US13766241Application Date: 2013-02-13
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Publication No.: US09404958B2Publication Date: 2016-08-02
- Inventor: Tetsuya Nozaki
- Applicant: CANON KABUSHIKI KAISHA
- Applicant Address: JP Tokyo
- Assignee: CANON KABUSHIKI KAISHA
- Current Assignee: CANON KABUSHIKI KAISHA
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JP2012-072341 20120327
- Main IPC: G01R31/18
- IPC: G01R31/18 ; G01R31/02 ; G06F1/26 ; G01R31/12
Abstract:
A first X capacitor is connected between one of a plurality of hot line sections of a hot line that is located at an output side of a first relay as viewed from a commercial alternating-current power supply, and one of a plurality of neutral line sections of a neutral line that is located at an input side of a second relay as viewed from the commercial alternating-current power supply. A second X capacitor is connected between one of the hot line sections that is located at the output side of the first relay as viewed from the commercial alternating-current power supply, and one of the neutral line sections that is located at an output side of the second relay as viewed from the commercial alternating-current power supply.
Public/Granted literature
- US20130257451A1 DIELECTRIC STRENGTH VOLTAGE TESTING METHOD FOR ELECTRONICS DEVICE Public/Granted day:2013-10-03
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