Invention Grant
US09404963B2 Apparatus and method for inspecting infrared solid-state image sensor
有权
用于检查红外固态图像传感器的装置和方法
- Patent Title: Apparatus and method for inspecting infrared solid-state image sensor
- Patent Title (中): 用于检查红外固态图像传感器的装置和方法
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Application No.: US14064588Application Date: 2013-10-28
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Publication No.: US09404963B2Publication Date: 2016-08-02
- Inventor: Hiroto Honda , Koichi Ishii , Hideyuki Funaki , Keita Sasaki
- Applicant: KABUSHIKI KAISHA TOSHIBA
- Applicant Address: JP Minato-ku
- Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee Address: JP Minato-ku
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2012-248682 20121112
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R31/28 ; G01R31/26

Abstract:
An apparatus includes: a current control unit to control an amount of constant current and supply a first and second constant currents to an infrared detection pixel; a constant current supply time control unit to control periods of time in which the first and second constant currents are supplied to the infrared detection pixel; an A-D converter to convert a first and second electrical signals from the infrared detection pixel into a first and second digital signals, the first and second electrical signals being generated when the first and second constant currents is supplied to the infrared detection pixel, respectively; a subtracting unit to calculate a difference between the first and second digital signals; and a determining unit to determine whether the infrared detection pixel is a defective pixel based on the absolute value of the difference calculated by the subtracting unit.
Public/Granted literature
- US20140132279A1 APPARATUS AND METHOD FOR INSPECTING INFRARED SOLID-STATE IMAGE SENSOR Public/Granted day:2014-05-15
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