Invention Grant
- Patent Title: X-ray detector
- Patent Title (中): X射线探测器
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Application No.: US14890573Application Date: 2014-05-15
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Publication No.: US09405022B2Publication Date: 2016-08-02
- Inventor: Yannick Arnoud , Olivier Guillaudin
- Applicant: Centre National de la Recherche Scientifique , Universite Joseph Fourier
- Applicant Address: FR Paris FR Saint Martin d'Heres
- Assignee: Centre National de la Recherche Scientifique,Universite Grenoble Alpes
- Current Assignee: Centre National de la Recherche Scientifique,Universite Grenoble Alpes
- Current Assignee Address: FR Paris FR Saint Martin d'Heres
- Agency: Wolf, Greenfield & Sacks, P.C.
- Priority: FR1354339 20130515
- International Application: PCT/FR2014/051132 WO 20140515
- International Announcement: WO2014/184496 WO 20141120
- Main IPC: G01T1/185
- IPC: G01T1/185 ; G01T1/29
Abstract:
The invention relates to a matrix device for measuring characteristics of an X-ray beam. The device includes a first set of detection cells of a size different from the cells of at least one second set of detection cells. Each cell corresponds to an ionization chamber including a detection electrode. The detection electrodes of all the cells have the same effective surface for collecting charges.
Public/Granted literature
- US20160116613A1 X-RAY DETECTOR Public/Granted day:2016-04-28
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