Invention Grant
US09405648B2 Built-in self-test circuit and semiconductor device including the same
有权
内置自检电路和包含相同的半导体器件
- Patent Title: Built-in self-test circuit and semiconductor device including the same
- Patent Title (中): 内置自检电路和包含相同的半导体器件
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Application No.: US14286748Application Date: 2014-05-23
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Publication No.: US09405648B2Publication Date: 2016-08-02
- Inventor: Hee-Won Kang
- Applicant: SK hynix Inc.
- Applicant Address: KR Gyeonggi-do
- Assignee: SK Hynix Inc.
- Current Assignee: SK Hynix Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2013-0149202 20131203
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G06F11/27 ; G01R31/3187 ; G11C29/44 ; G11C29/16
Abstract:
A built-in self-test circuit includes a command storage unit that stores commands inputted from an external device, an input/output control unit that controls the command storage unit to sequentially store the commands and sequentially output stored commands as internal commands in a test operation, and a command decoder unit that decodes the internal commands outputted from the command storage unit and outputs a test command.
Public/Granted literature
- US20150154095A1 BUILT-IN SELF-TEST CIRCUIT AND SEMICONDUCTOR DEVICE INCLUDING THE SAME Public/Granted day:2015-06-04
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