Invention Grant
- Patent Title: Scratch detection method and apparatus
- Patent Title (中): 划痕检测方法和装置
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Application No.: US13806360Application Date: 2011-06-30
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Publication No.: US09406115B2Publication Date: 2016-08-02
- Inventor: Wei Zhou , Michael Grant
- Applicant: Wei Zhou , Michael Grant
- Applicant Address: US NJ Flanders
- Assignee: Rudolph Technologies, Inc.
- Current Assignee: Rudolph Technologies, Inc.
- Current Assignee Address: US NJ Flanders
- Agency: Dicke, Billig & Czaja, PLLC
- International Application: PCT/US2011/042656 WO 20110630
- International Announcement: WO2012/006221 WO 20120112
- Main IPC: G06K9/62
- IPC: G06K9/62 ; G06T7/00 ; G02B21/00

Abstract:
A method of identifying discontinuities in the surface of a substrate is herein disclosed. An object plane of an imaging system is positioned at a focal position associated with a discontinuity and an image is captured, the discontinuity having a relatively higher contrast with respect to the remainder of the surface of the substrate. The discontinuity is thereby more readily discernable than when the focal plane is positioned at the surface of the substrate. Analysis of discontinuities may include the extraction of discontinuity characteristics.
Public/Granted literature
- US20130216122A1 SCRATCH DETECTION METHOD AND APPARATUS Public/Granted day:2013-08-22
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