Invention Grant
- Patent Title: Method and apparatus for generating depth information
- Patent Title (中): 用于生成深度信息的方法和装置
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Application No.: US14307506Application Date: 2014-06-18
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Publication No.: US09406140B2Publication Date: 2016-08-02
- Inventor: Yun-Chin Lee , Chia-Chun Tseng , Yu-Chia Chung
- Applicant: Altek Semiconductor Corp.
- Applicant Address: TW Hsinchu
- Assignee: Altek Semiconductor Corp.
- Current Assignee: Altek Semiconductor Corp.
- Current Assignee Address: TW Hsinchu
- Agency: Jianq Chyun IP Office
- Priority: TW103114050A 20140417
- Main IPC: G06T7/00
- IPC: G06T7/00 ; H04N13/00 ; G06T5/00

Abstract:
A method and an apparatus for generating depth information are provided. A main depth map associated with one of a left image and a right image and corresponding to multiple first pixels is obtained. The left image or the right image associated with the main depth map is divided into multiple segments according to pixel information, so as to obtain a segment distribution map including the segments. Multiple invalid depth values which do not match to a reliable condition are removed from the main depth map according to the segment distribution map, so as to generate a necessary repair depth map including multiple holes. Multiple optimized depth values are respectively generated for the holes in the necessary repair depth map according to the segment distribution map, and the optimized depth values are filled into the necessary repair depth map to generate an optimized depth map.
Public/Granted literature
- US20150302595A1 METHOD AND APPARATUS FOR GENERATING DEPTH INFORMATION Public/Granted day:2015-10-22
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