Invention Grant
- Patent Title: Instruction beam detection apparatus and method of detecting instruction beam
- Patent Title (中): 指令光束检测装置及指示光束检测方法
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Application No.: US13590610Application Date: 2012-08-21
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Publication No.: US09407305B2Publication Date: 2016-08-02
- Inventor: Takashi Ichimori
- Applicant: Takashi Ichimori
- Applicant Address: JP Kanagawa
- Assignee: LAPIS SEMICONDUCTOR CO., LTD.
- Current Assignee: LAPIS SEMICONDUCTOR CO., LTD.
- Current Assignee Address: JP Kanagawa
- Agency: Kubotera & Associates, LLC
- Priority: JP2011-181925 20110823
- Main IPC: H04N5/33
- IPC: H04N5/33 ; G05B19/02 ; H04B1/20

Abstract:
A remote control device includes a light source for irradiating an instruction beam in a non-visible wave length range, and an operation unit for controlling the light source to irradiate the instruction beam when the operation unit is operated. An instruction beam detection apparatus includes an image capturing unit for capturing an image of the instruction beam irradiated from the light source of the remote control device within a detection range thereof; a storage unit for storing a first image captured with the image capturing unit; and a detection unit for detecting a position of the instruction beam on a second image according to a differential image between the first image stored in the storage unit and the second image newly captured with the image capturing unit.
Public/Granted literature
- US20130049927A1 INSTRUCTION BEAM DETECTION APPARATUS AND METHOD OF DETECTING INSTRUCTION BEAM Public/Granted day:2013-02-28
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